Impact of IoT on Maintenance

Speaking Of Reliability: Friends Discussing Reliability Engineering Topics | Warranty | Plant Maintenance

Impact of IoT on Maintenance

Abstract

Kirk and Fred discuss the impact of the Internet of Things (IoT) on maintenance and the data feedback to the manufacturer on usage and failure data.

Key Points

Join Kirk and Fred as they discuss on the new capabilities of products to connect with the Internet and how they open up more detailed and widespread details on the actual field use, health prognostics, and failure modes.

Topics include:

• Automobiles, and especially the new electric vehicles, now provide so much data on driving actions such as acceleration, braking, and other use conditions that they are much more useful for improving the design from the previous model year.
• Telemetry that is now built into capital manufacturing equipment and systems that can provide prognostics on system wear and degradation can prevent unscheduled and costly downtime.
• Many manufacturers are including IoT in their devices and are receiving massive amounts of data that must be parsed and analyzed to derive valuable prognostics for improving maintenance and design

Enjoy an episode of Speaking of Reliability. Where you can join friends as they discuss reliability topics. Join us as we discuss topics ranging from design for reliability techniques to field data analysis approaches.

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Show Notes

Please click on this link to access a relatively new analysis of traditional reliability prediction methods article from the US ARMY and CALCE titled “Reliability Prediction – Continued Reliance on a Misleading Approach”. It is in the public domain, so please distribute freely. Trying to predict reliability for development is a misleading a costly approach.

You can now purchase the most recent recording of Kirk Gray’s Hobbs Engineering 8 (two 4 hour sessions) hour Webinar “Rapid and Robust Reliability Development 2022 HALT & HASS Methodologies Online Seminar” from this link.

For more information on the newest discovery testing methodology here is a link to the book “Next Generation HALT and HASS: Robust design of Electronics and Systems” written by Kirk Gray and John Paschkewitz.

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